Search results for "Pole figure"
showing 2 items of 2 documents
2018
CrN thin films with an N/Cr ratio of 95% were deposited by reactive magnetron sputtering onto (0 0 0 1) sapphire substrates. X-ray diffraction and pole figure texture analysis show CrN (1 1 1) epitaxial growth in a twin domain fashion. By changing the nitrogen versus argon gas flow mixture and the deposition temperature, thin films with different surface morphologies ranging from grainy rough textures to flat and smooth films were prepared. These parameters can also affect the CrN x system, with the film compound changing between semiconducting CrN and metallic Cr2N through the regulation of the nitrogen content of the gas flow and the deposition temperature at a constant deposition pressur…
Preparation and x-ray pole-figure characterization of DC-sputtered Bi-2201, Bi-2212 and Bi-2223 thin films
1997
Thin films of the three members of the superconducting series , n = 1,2,3, were prepared by diode sputtering. X-ray characterization shows that all the films are single phase and c-axis oriented and in addition they are epitaxially grown. The latter is found by x-ray pole-figure measurements taken with a four-circle diffractometer. These are emphasized in this work. AC susceptibility measurements show that, while the 2201 films are not superconducting until 4 K, the transition temperatures of the 2212 films are 82 K - 90 K and of the 2223 films 84 K - 89 K.